RECTIFYING BEHAVIOR AND TRANSPORT PROPERTY IN HETEROJUNCTION COMPOSED OF La_(0.8)Sr_(0.2)MnO_3 and 0.7wt% Nb-doped SrTiO_3 MODULATED BY DEPOSITION OXYGEN PRESSURES

HE Wen-lan,CHENG Xiao-hu,ZHANG Xing,LI Guang,JIN Shao-wei
2012-01-01
Abstract:Heteroepitaxial junction composed of the La0.8Sr0.2MnO3(LSMO) and the(100) 0.7wt%Nb:SrTiO3(NSTO) has been fabricated by pulsed-laser deposition.The effect of the in-situ deposition oxygen pressures and the annealed in vacuum on the structure and the rectifying current-voltage behaviors in LSMO/NSTO(100) heterojunctions were carefully studied.X-ray linear scans and atomic force microscope(AFM) patterns indicate that the LSMO/NSTO(100) heterojunctions grown at lower oxygen pressures have a better epitaxial quality and the smooth surface.The result of current-voltage(I~V) curves shows that the p~n junction grown at oxygen pressure of 100 mTorr exhibits an excellent rectifying behavior,but the p~n junction grown at a pressure of 240 mTorr displays a flat the I~V curves,which is ascribed to the increase of the lattice defects in p~n junction interface.As a contrast,the transport properties of epitaxial LSMO/SrTiO3(100) films were also studied by the modulating deposition oxygen pressures.The resistivity measurements shown that the increase of overall resistivity and the low of metal-insulator transition temperatures Tp in the LSMO films grown at lower oxygen pressures can be ascribed to the oxygen vacancy inducing the decrease of Mn4+ ions as well as the distortion of MnO6 octahedron.
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