Deviations from Plastic Barriers Inbi2sr2cacu2o8+δthin Films

YZ Zhang,Z Wang,XF Lu,HH Wen,JF de Marneffe,R Deltour,AGM Jansen,P Wyder
DOI: https://doi.org/10.1103/physrevb.71.052502
2005-01-01
Abstract:Resistive transitions of an epitaxial Bi2Sr2CaCu2O8+delta thin film were measured in various magnetic fields (H parallel to c), ranging from 0 to 22.0 T. Rounded curvatures of low resistivity tas are observed in Arrhenius plot, and considered to relate to deviations from plastic barriers. In order to characterize these deviations, an empirical barrier form is developed, which is found to be in good agreement with experimental data and coincide with the plastic barrier form in a limited magnetic field range. Using the plastic barrier predictions and the empirical barrier form, we successfully explain the observed deviations.
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