Abstract:SRAM-Filed Programmable Gate Arrays (FPGA) have become one of the most important carriers of digital electronic system because of its many inborn advantages.However, as manufacture of Integrated Circuit evolves towards Very Deep Sub-Micron technology, FPGA designers must be careful of circuit's Single Event Upset (SEU) susceptibility when used in hostile environment, such as avionics and space applications where reliability is vital.We proposed a SEU-fault emulation platform to evaluate circuit's SEU mitigation performance.The platform does not need any external circuit or micro controller to manage fault emulation process compared with existing approach.Source codes of Circuit Under Test (CUT) do not need to be modified or intruded with any component.It is a non-intrusive testing.Communication between host-computer and emulation board is minimized to accelerate fault injection speed.Experimental result shows that a single fault injecting (including Multi-Bits-Upset) only costs 29us.A circuit state reloading technology is exploited to increase emulation efficiency.Moreover, in the field of evolvable hardware, genetic operations can be reconfigured and its fitness can be evaluated on-line using the proposed fast dynamic reconfiguration method, which is useful for implementing self-repair and self-evolutionary hardware.

Design for Testability in Honeycomb-like Rapid Embedded System Platform

Software Framework for Component-Based Rapid Prototyping System Design

Development of Eclipse Based Boundary-scan Tester Software

Designs of a modular general test platform

Design for HW/SW Co-Testing Based on FPGA

A Kind of Low-cost Non-intrusive Autonomous Fault Emulation System

Testing Methodologies for Embedded Systems and Systems-on-Chip

The Design Of A Rapid Prototyping Platform For Hardware/Software Co-Design

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

A Standalone FPGA-test Platform with Bi-directional Ports Supported

Design of Rapid Prototyping Platform for Hardware/Software Co-design of Embedded System

Design of testing platform for seeker based on embedded system

An improved method for test chip design

A Deep Research on the Chip Verification Platform Based on Network

Design and Implement for Test in a Complex System on Chip

Testing of a 32-Bit High Performance Embedded Microprocessor

The Design of Distributed Hardware Platform for Complex Electronic System Testing

Testability design of NRS4000 microprocessor

Design of a Random Test Platform for DSP Serials Used in Embedded Systems

Design Retargetable Platform System for Microprocessor Functional Test

A Platform for System-on-a-chip Design Prototyping