Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware
Tianming Ni,Xiaoqing Wen,Hussam Amrouch,Cheng Zhuo,Peilin Song
DOI: https://doi.org/10.1145/3631476
IF: 1.447
2023-01-01
ACM Transactions on Design Automation of Electronic Systems
Abstract:The research on design for testability and reliability of security-aware hardware has been important in both academia and industry. With ever-growing globalization, commercial hardware design, manufacturing, transportation, and supply now involve many different countries, resulting in aggravated vulnerability from hardware design to manufacturing. Hardware with malicious purposes implanted from the third-party manufacturing process may control the operation of a circuit and tamper its functions, causing serious security issues. However, hardware includes not only devices and circuits but also systems. An important fact is that testability, reliability, and security technologies come from different design layers, but the impact evaluation is conducted at the system level. In other words, the testability, reliability, and security design of different layers can be carried out in a holistic manner to achieve optimization for the whole system. In addition, the testability, reliability, and security design technologies of each design layer can be collaboratively conducted to achieve better performance. The testability, reliability, and security tradeoff has garnered attention from academia and industry, particularly in the Post-Moore Era, due to the complexities and opportunities arising from new architectures and technologies.