FMR study on patterned and unpatterned magnetic thin films

Y Zhai,Y.X Xu,J Shi,S Tehrani,J.G Long,M.H Pan,Z.H Lu,M Lu,H.R Zhai
DOI: https://doi.org/10.1016/S0304-8853(00)01279-8
IF: 3.097
2001-01-01
Journal of Magnetism and Magnetic Materials
Abstract:Ferromagnetic resonance linewidth, DeltaH, of polycrystalline Ta50 Angstrom /Ni80Fe20/Ta50 Angstrom films and patterned sandwich structures (NiFeCo60 Angstrom /Cu30 Angstrom /NiFeCo30 Angstrom) of submicron size was studied. DeltaH(parallel to) is found to be in the range of 32-41 Oe for single-layer films with thickness larger than 100 Angstrom, which seems to be mainly due to intrinsic damping. For films thinner than 100 Angstrom, DeltaH(parallel to) increases sharply, approaching a peak around 50 Angstrom and then drops. For patterned films, DeltaH(parallel to) is found to increase with the decrease of element size. Magnetization measurements show a similar trend between coercivity and the element size. (C) 2001 Elsevier Science B.V. All rights reserved.
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