On the uniformity of field emission in screen printed CNT-cathodes: the effects of the cathode roughness

Weihua Liu,Changchun Zhu,Cao Meng,Fanguang Zeng
DOI: https://doi.org/10.1016/j.mejo.2005.06.004
IF: 1.992
2006-01-01
Microelectronics Journal
Abstract:The effects of the cathode roughness on the trace of the electron beams were given by numerical result for the first time. And some of the simulation results were confirmed in a testing device.
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