Detection and Analysis of the Responsivity and NEP for HEMT Terahertz Detectors

Yang Xinxin,Sun Jiandong,Qin Hua
DOI: https://doi.org/10.3969/j.issn.1671-4776.2013.02.001
2013-01-01
Abstract:The responsivity and noise equivalent power(NEP) of the terahertz detectors based on the AlGaN/GaN high electron mobility transistor(HEMT) were tested and analyzed at 0.8-1.1 THz.Under the terahertz wave irradiation,the DC photocurrent sensitively modulated by the gate voltage was observed at the source-drain end of the HEMT terahertz detector.At 300 K and 77 K,the current responsivities are 83 mA/W and 4.1 A/W,the voltage responsivities are 4 kV/W and 50 kV/W,the noise equivalent powers are 22 pW/Hz0.5 and 1 pW/Hz0.5,respectively.Through two kinds of the typical measurement methods and the comparison of the experimental results,the main factors affecting the responsivity and noise equivalent power of the detector were identified,and the specific measures to enhance the responsivity and reduce the noise equivalent power were proposed.
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