Abstract:There is a need to understand materials exposed to overlapping extreme environments such as high temperature, radiation, or mechanical stress. When these stressors are combined there may be synergistic effects that enable unique microstructural evolution mechanisms to activate. Understanding of these mechanisms is necessary for the input and refinement of predictive models and critical for engineering of next generation materials. The basic physics and underlying mechanisms require advanced tools to be investigated. The in situ ion irradiation transmission electron microscope (I³TEM) is designed to explore these principles. To quantitatively probe the complex dynamic interactions in materials, careful preparation of samples and consideration of experimental design is required. Particular handling or preparation of samples can easily introduce damage or features that obfuscate the measurements. There is no one correct way to prepare a sample; however, many mistakes can be made. The most common errors and things to consider are highlighted within. The I³TEM has many adjustable variables and a large potential experimental space, therefore it is best to design experiments with a specific scientific question or questions in mind. Experiments have been performed on large number of sample geometries, material classes, and with many irradiation conditions. The following are a subset of examples that demonstrate unique in situ capabilities utilizing the I3TEM. Au nanoparticles prepared by drop casting have been used to investigate the effects of single ion strikes. Au thin films have been used in studies on the effects of multibeam irradiation on microstructure evolution. Zr films have been exposed to irradiation and mechanical tension to examine creep. Ag nanopillars were subjected to simultaneous high temperature, mechanical compression, and ion irradiation to study irradiation induced creep as well. These results impact fields including: structural materials, nuclear energy, energy storage, catalysis, and microelectronics in space environments.

Box 8: Sample Preparation For Transmission Electron Microscopy Using A Focused Ion Beam

Self-marked preparation of site-specific transmission electron microscope lamellae of nanodevices using focusing ion beam technique.

Transmission electron microscopy sample preparation method for micrometer-sized powder particles using focused ion beam

The Trends of in Situ Focused Ion Beam Technology: Toward Preparing Transmission Electron Microscopy Lamella and Devices at the Atomic Scale

A handy method for high quality specimen preparation for chip-based in-situ transmission electron microscopy

Preparation of parallel with the sample surface TEM sample using FIB technology

Novel techniques of preparing TEM samples for characterization of irradiation damage.

Optimization of TEM Sample Preparation Methods by FIB for the Increase of Throughput

Preparation of ultrathin TEM sample by focused ion beam technique-the application of X2 sample holder

An Efficient and Cost-Effective Method for Preparing Transmission Electron Microscopy Samples from Powders

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling

Ultramicrotomy Preparation of Magnetic Nanoparticles for Transmission Electron Microscopy

Applications of the FIB lift-out technique for TEM specimen preparation

Fast Preparation of Ultrathin FIB Lamellas for MEMs-Based <i>In Situ</i> TEM Experiments

Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens

Advanced preparation of plan-view specimens on a MEMS chip for in situ TEM heating experiments

The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass

An optimized TEM specimen preparation method of quantum nanostructures

Preparation of TEM Specimens from Gas-Atomized Fe-6.5wt.%Si Powders with Several Micrometers Using Focused Ion Beam

Optimized Pre-Thinning Procedures of Ion-Beam Thinning for TEM Sample Preparation by Magnetorheological Polishing