Deterministic DEM DAC Performance Analysis

Hanjun Jiang,Degang Chen,Randall L. Geiger

DOI: https://doi.org/10.1109/iscas.2007.377881

2007-01-01

Abstract:A rigorous and complete analysis of the deterministic DEM (DDEM) DAC performance is presented. With this analysis, DDEM DAC's equivalent linearity as ADC static linearity test stimulus source can be precisely predicted. Simulation result is given to validate this theoretical analysis.

What problem does this paper attempt to address?

Testing High Resolution Adcs With Low Resolution/Accuracy Deterministic Dynamic Element Matched Dacs

Hj Jiang,B Olleta,Dg Chen,Rl Geiger

DOI: https://doi.org/10.1109/TIM.2007.903621

IF: 5.6

2004-01-01

IEEE Transactions on Instrumentation and Measurement

Abstract:This paper presents a Deterministic Dynamic Element Matching (DDEM) approach which is applied to low precision DACs to generate stimulus signals for ADC testing. Both simulation results and experimental results from a fabricated DDEM DAC are presented to verify the performance. The ADC testing performance of an 8-bit DDEM DAC (linearity less than 5 bits without DDEM) is comparable to or better than the best results reported in the literature using on-chip linear ramp generators. The DDEM technique offers great potential for use in both production test and built-in-self-test(BIST) environments.
Analysis and Modeling of Dynamic Error in Current-Steering DAC

Lenian He

2011-01-01

Abstract:The challenge has been imposed on the circuit designers to come up with a high speed current-steering digital to analog converter(DAC) with high dynamic performance which is widely used in broad-band wireless communication systems.The non-ideal switching behavior of the current switch is the important source of the dynamic error which results in great harmonic distortion in current-steering DAC.This phenomena was analyzed and deduced to achieve a formula to describe the relationship among amplitude of harmonic distortion,parameters of the designed DAC circuit and the employed encoding scheme.A behavioral model of current-steering DAC was built in Matlab to estimate the impact of the non-ideal switching behavior on DACs spurious-free dynamic range(SFDR).The model was verified by comparing the simulation results of behavioral model with that of a 12-bit transistor-level current-steering DAC circuit.Simulation results of behavioral model were analyzed to acquire important guide line for current-steering DAC circuit design.
Dither Incorporated Deterministic Dynamic Element Matching For High Resolution Adc Test Using Extremely Low Resolution Dacs

Hj Jiang,Dg Chen,Rl Geiger

DOI: https://doi.org/10.1109/ISCAS.2005.1465578

2005-01-01

Abstract:A novel Dither Incorporated Deterministic Dynamic Element Matching (DIDDEM) approach is proposed. With this approach, the combined output of a DDEM DAC and a dither DAC serves as the stimulus to an ADC under test. Theoretical analysis shows that the test performance with the DiDDEM DAC is equivalent to that of a DAC with an ENOB (Effective Number Of Bits) equal to the summation of the ENOB's of the DDEM DAC and the dither DAC plus log(2)p, where p is the DDEM iteration number. The test performance using DiDDEM is also validated by simulation results.
Analysis and Modeling of the Glitch Error in Current-Steering D/A Converter

Si Hong-Wei,He Le-nian

DOI: https://doi.org/10.1109/icece.2010.109

2010-01-01

Abstract:For a high-speed and high-resolution current-steering D/A Converter (DAC), Spurious-Free dynamic range (SFDR) becomes a major limiting factor for its performance. This paper gives an overall analysis of its dynamic error due to non-ideal switching behavior and identifies the link between the 3rd or higher order harmonic distortion and digital encoding scheme for the first time so far as our knowledge. A behavioral model of non-ideal current-steering DAC is developed to estimate its SFDR property. A 12-bit up to 1GS/s transistor-level circuit of current-steering DAC is designed using 0.18 um CMOS Mixed-Signal process. The simulation result demonstrates the validation of the established behavior model.
Deterministic dynamic element matching: an enabling technology for soc built-in-self-test

Hanjun Jiang,Degang Chen

DOI: https://doi.org/10.31274/rtd-180813-15384

2005-01-01

Abstract:The analog-to-digital converter (ADC) is a key building block of today's high-volume systems-on-a-chip (SoCs). Built-in-self-test (BIST) is the most promising solution to testing deeply-embedded ADCs. Cost-effective stimulus source with on-chip integrability has been viewed as the bottleneck of ADC BIST, and consequentially the bottleneck of SoC BIST and BIST-based self-calibration. The deterministic dynamic element matching (DDEM) technique has been proposed as a solution to this problem. In this work, rigorous theoretical analysis is presented to show the performance of a DDEM digital-to-analog converter (DAC) as an ADC linearity test stimulus source. Guided by the insight obtained this analysis, a systematic approach for cost-effective DDEM DAC design is proposed. Two generations of DDEM DACs have been designed, fabricated, and measured. 12-bit equivalent linearity was achieved from the first DDEM DAC with 8-bit apparent resolution and less than 5-bit raw linearity after systematic error compensation. The achieved 12-bit linearity outperforms any on-chip stimulus source in literature. Based on the first design, a new DDEM DAC with 12-bit apparent resolution, 10-bit raw linearity, and 9-bit DDEM switching was designed with improved design technique. This DAC was fabricated in standard 0.5-pm CMOS technology with a core die area of 2 mm2. Clear ramp signals could be observed on an oscilloscope when the DDEM DAC was clocked at 100 MHz. Laboratory testing results confirmed that the new DDEM DAC achieved at least a 16-bit equivalent linearity; this was limited by the available instrumentation, which has 18-bit linearity. It outperforms any previously reported on-chip stimulus source in terms of ADC BIST performance by 5 bits. The robust performance, low cost, and short design cycle for on-chip implementation make DDEM an enabling technology for SoC BIST and self-calibration. Two new approaches based on DDEM are developed to further boost the die area efficiency, improving the basic DDEM approach. The first is termed segmented DDEM, and the second is dither-incorporated DDEM (DiDDEM). It has been shown through mathematical analysis and simulation that these can maintain the performance of the basic DDEM approach while greatly reducing the implementation cost.
Testing high resolution ADCs using deterministic dynamic element matching

Beatriz Olleta,Hanjun Jiang,Degang Chen,Randall L. Geiger

DOI: https://doi.org/10.1109/ISCAS.2004.1328346

2004-01-01

Abstract:Dynamic element matching (DEM) is an effective approach to achieving good average performance in the presence of major mismatch in matching-critical circuits. This paper presents a deterministic DEM (DDEM) strategy for ADC testing that offers substantial reductions in testing cost. The approach is mathematically formulated and validated with simulation results that show the number of test vectors needed is comparable to what are concurrently used with standard code density linearity testing. It is demonstrated that the DDEM method can be used to accurately test ADCs with linearity that far exceeds that of the DAC used as a signal generator. This technique offers potential for use in both production test and BIST environments where high linearity devices are difficult to test and characterize.
An 18-Bit High Performance Audio Sigma-Delta D/A Converter

Zhang Hao,Huang Xiaowei,Han Yan,Ray C Cheung,Han Xiaoxia,Wang Hao,Liang Guo

DOI: https://doi.org/10.1088/1674-4926/31/7/075002

2010-01-01

Journal of Semiconductors

Abstract:A multi-bit quantized high performance sigma-delta (Sigma-Delta) audio DAC is presented. Compared to its single-bit counterpart, the multi-bit quantization offers many advantages, such as simpler Sigma-Delta modulator circuit, lower clock frequency and smaller spurious tones. With the data weighted average (DWA) mismatch shaping algorithm, element mismatch errors induced by multi-bit quantization can be pushed out of the signal band, hence the noise floor inside the signal band is greatly lowered. To cope with the crosstalk between digital and analog circuits, every analog component is surrounded by a guard ring, which is an innovative attempt. The 18-bit DAC with the above techniques, which is implemented in a 0.18 mu m mixed-signal CMOS process, occupies a core area of 1.86 mm(2). The measured dynamic range (DR) and peak SNDR are 96 dB and 88 dB, respectively.
An 18-Bit High Performance Audio Σ-Δ D/A Converter

Han Xia

DOI: https://doi.org/10.1088/1674-4926/31/7/075002

2010-01-01

Abstract:A multi-bit quantized high performance sigma-delta (U-A) audio DAC is presented. Compared to its single- bit counterpart, the multi-bit quantization offers many advantages, such as simpler U-A modulator circuit, lower clock frequency and smaller spurious tones. With the data weighted average (DWA) mismatch shaping algorithm, element mismatch errors induced by multi-bit quantization can be pushed out of the signal band, hence the noise floor inside the signal band is greatly lowered. To cope with the crosstalk between digital and analog circuits, every analog component is surrounded by a guard ring, which is an innovative attempt. The 18-bit DAC with the above techniques, which is implemented in a 0.18 m mixed-signal CMOS process, occupies a core area of 1.86 mm 2 . The measured dynamic range (DR) and peak SNDR are 96 dB and 88 dB, respectively.
Parameter Optimization Of Deterministic Dynamic Element Matching Dacs For Accurate And Cost-Effective Adc Testing

Hj Jiang,B Olleta,R Geiger

DOI: https://doi.org/10.1109/ISCAS.2004.1328347

2004-01-01

Abstract:Deterministic dynamic element matching (DDEM) is applied to low accuracy DACs for high resolution ADC test. The testing accuracy is impressive while the test cost is relatively low. This work tries to further optimize the DDEM parameters based on improving the testing accuracy and reducing the test hardware and computation cost. The optimization is accomplished by theoretical analysis and numerical simulation. Some typical parameter values are suggested by this work.
Understanding High-Resolution Dynamic Element Matching DACs

Enrique Alvarez-Fontecilla,Paul S. Wilkins,Steven C. Rose

DOI: https://doi.org/10.1109/mcas.2023.3325504

IF: 4.04

2024-02-03

IEEE Circuits and Systems Magazine

Abstract:DEM in the context of non-segmented DACs is well understood in general, and numerous articles can be found in the literature on this topic and its fundamentals. DEM in the context of segmented DACs is a more puzzling subject, as randomizing the mismatch-induced error of a DAC whose elements are nominally different in size is not straightforward. In this article, we cover the topic of segmented DEM DACs via the step-bystep derivation of a simple DAC architecture that is linear by virtue of its shuffling scheme.

engineering, electrical & electronic
A 200 Khz Bandwidth Ea Dac With A Spur Free Modulator

Chen Yaya,Zhang Shifeng,Cao Tianlin,Han Xiaoxia,Ray C. C. Cheung,Han Yan

2016-01-01

Abstract:This paper creatively presents a sigma-delta digital to analog converter (Sigma Delta DAC) which achieves 88.5 dB signal to noise and distortion ratio (SNDR) in the 200 KHz bandwidth. The proposed modulator with a high pass dither block can eliminate harmonic spurs without increasing the noise floor in band. In addition, a 2nd-order vector feedback dynamic element match (VFBDEM) provides a good harmonic suppression via mismatch noise shaping. What's more, the cut-off frequency of the proposed modified model of the 1st-order low-pass SC DAC is accordance with that of Sigma Delta DAC, consequently, filtering out high frequency noise to alleviate the SNDR decrease caused by clock jitter.
A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations

Beatriz Olleta,Hanjun Jiang,Degang Chen,Randall L. Geiger

DOI: https://doi.org/10.1109/TIM.2006.873821

IF: 5.6

2006-01-01

IEEE Transactions on Instrumentation and Measurement

Abstract:Dynamic element matching (DEM) is capable of providing good average linearity performance in matching critical circuits in the presence of major component mismatch, but the approach has received minimal industrial adoption outside of Sigma-Delta structures because of challenges associated with implementation of a required randomizer and because of the time-local nonstationarity. This paper present...
A 200 KHz Bandwidth ΣΔ DAC with a Spur Free Modulator

Chen Yaya,Zhang Shifeng,Cao Tianlin,Han Xiaoxia,Ray C. C. Cheung,Han Yan

DOI: https://doi.org/10.1109/icsict.2016.7999071

2016-01-01

Abstract:This paper creatively presents a sigma-delta digital to analog converter (ΣΔDAC) which achieves 88.5 dB signal to noise and distortion ratio (SNDR) in the 200 KHz bandwidth. The proposed modulator with a high pass dither block can eliminate harmonic spurs without increasing the noise floor in band. In addition, a 2nd-order vector feedback dynamic element match (VFBDEM) provides a good harmonic suppression via mismatch noise shaping. What's more, the cut-off frequency of the proposed modified model of the 1st-order low-pass SC DAC is accordance with that of ΣΔDAC, consequently, filtering out high frequency noise to alleviate the SNDR decrease caused by clock jitter.
Design of a 12 bit High-Stability Digital-to-Analog Converter

Zhiyu Wang,Jinpeng Qiu,Tong Liu,Jiarui Liu,Jingjing Lü,Faxin Yu

DOI: https://doi.org/10.13290/j.cnki.bdtjs.2017.04.002

2017-01-01

Abstract:A 12 bit high-stability controlling digital-to-analog converter (DAC) was designed.By integrating a new low-offset bandgap reference (BGR) with stable start-up circuit,the DAC improved the stability of the reference circuit and the sensitivity to the temperature and process.An improved twostage resistor string structure was adopted by the DAC,which improved the accuracy of the DAC and reduced the influence of the process concentration gradient on the overall performance without increasing the circuit power consumption and expanding the chip area through the switch resistance matching and special layout.Based on the CSMC 0.5 μm 5 V 1P4M process,the designed DAC chip was verified.The test results show that the differential nonlinearity (DNL) of the DAC at room temperature is less than 0.45 LSB and the integral nonlinearity (INL) is less than 1.5 LSB.Moreover,the DNL in the temperature range of-55 ℃ to 125 ℃ is less than 1 LSB and the INL is less than 2.5 LSB.The power consumption of the 5 V supply voltage is 3.5 mW,achieving the design objectives of high precision and high stability.
A Novel Dynamic Element Match Technique in Current-Steering DAC

Baoguang Liu,Yuan Wang,Guangliang Guo,Song Jia,Xing Zhang

DOI: https://doi.org/10.1109/asicon.2013.6811898

2013-01-01

Abstract:A novel dynamic element match (DEM) named Segmented Thermo Data Weighted Average (STDWA) for the Nyquist-rate current-steering digital to analog converter (DAC) has been presented in this paper. In this method, when the input code changes, it only increase or decrease the chosen unit current source in order to reduce the signal glitch. Compared with full random DEM technique, this approach can reach a better static performance. Meanwhile, it can eliminate signal dependent distortions to achieve good linearity at high sampling frequencies as well as other DEM implementations.
A random DEM technique with minimal element transition rate for high-speed DACs

Peijun Wang,Nan Sun

DOI: https://doi.org/10.1109/ISCAS.2014.6865345

2014-01-01

Abstract:This paper presents a random dynamic element matching (DEM) technique for current-steering digital-to-analog converters (DACs). It randomizes the element selection process, and keeps the number of transitions to minimum. As a result, it does not introduce extra dynamic errors caused by inter-symbol interference (ISI). This technique also alleviates the impact of linear gradient errors due to the fabrication process. A behavioral Matlab model for 12-bit segmented current-steering DAC is developed. Simulation results proves that the proposed algorithm improves the DAC linearity effectively.
A Novel Dynamic Element Matching Technique In Current-Steering Dac

Wei Su,Yuan Wang,Junlei Zhao,Song Jia,Xing Zhang

DOI: https://doi.org/10.1109/EDSSC.2011.6117746

2011-01-01

Abstract:This paper presents a novel dynamic element matching (DEM) method called Thermo Data Weighted Average (TDWA) for Nyquist-rate current - steering digital to analog converter (DAC). When the input code changes, it only increase or decrease the number of unit current source which is be chosen. This approach can reach a better static performance than full random DEM technique but also eliminate signal dependent distortions to achieve good linearity at high sampling frequencies as other DEM implementations.
Binary tree structure random Dynamic Element Matching technique in current-steering DACs

Guangliang Guo,Yuan Wang,Wei Su,Song Jia,Ganggang Zhang,Xing Zhang

DOI: https://doi.org/10.1109/ICSICT.2012.6467895

2012-01-01

Abstract:A novel Dynamic Element Matching (DEM) method is presented to improve the static and dynamic performance of Nyquist-rate current-steering digital to analog converter (DAC). Compared to conventional DEM methods, this approach only increases or decreases the number of selected unit current sources randomly when the input code changes. Thus, signal dependent distortions can be eliminated efficiently at high sampling frequencies. A 6-bit current-steering DAC model adopting the proposed DEM coding method was built up to verify the performance in MATLAB. It could reach a better SFDR (56dB) value and a better DNL (0.26LSB) and INL (0.45LSB) value compared with traditional DEM methods.
Dynamic Element Matching with Signal-Independent Element Transition Rates for Multibit $\delta\sigma$ Modulators

Arindam Sanyal,Long Chen,Nan Sun

DOI: https://doi.org/10.1109/tcsi.2015.2407434

2015-01-01

IEEE Transactions on Circuits and Systems I Regular Papers

Abstract:This paper presents a novel dynamic element matching (DEM) technique for multi-bit ΔΣ digital-to-analog converters (DACs). The proposed technique can address errors due to both static element mismatch and dynamic inter-symbol-interference (ISI). The proposed technique ensures no ISI-induced distortion even at large signal amplitudes by de-correlating the instantaneous number of DAC transitions from the signal. It can shape the total number of transitions and whiten the individual transition sequence, thereby significantly reducing the in-band ISI errors. The proposed technique can be easily extended to higher-order shaping for both static mismatch and ISI errors. An efficient hardware implementation based on the vector-quantizer mismatch shaping framework is also presented. Simulation results show that the proposed technique can significantly improve DAC linearity in presence of both static mismatch and dynamic ISI errors.
A 14-bit 300MHz pipelined DEM DAC with enhanced dynamic linearity

Zhao Junlei,Wang Yuan,Zhao Zhihui,Jia Song

DOI: https://doi.org/10.1109/PRIMEASIA.2010.5604954

2010-01-01

Abstract:This paper presents a 14-bit digital-to-analog converter (DAC) with pipelined dynamic element matching to eliminate signal-dependent distortions and achieve good linearity at high sampling frequencies. A return-to-zero output stage is developed to enhance the dynamic linearity and increase the output impedance of current sources. And a novel current source array is employed to eliminate systematic and graded errors. The spurious-free dynamic range is 80.9dB at 312MS/s with a 150MHz input. The DAC is implemented in a 0.13-μm CMOS process, and consumes 48mW at 1.2-V power supply and 312MS/s.

Deterministic DEM DAC Performance Analysis

Testing High Resolution Adcs With Low Resolution/Accuracy Deterministic Dynamic Element Matched Dacs

Analysis and Modeling of Dynamic Error in Current-Steering DAC

Dither Incorporated Deterministic Dynamic Element Matching For High Resolution Adc Test Using Extremely Low Resolution Dacs

Analysis and Modeling of the Glitch Error in Current-Steering D/A Converter

Deterministic dynamic element matching: an enabling technology for soc built-in-self-test

Testing high resolution ADCs using deterministic dynamic element matching

An 18-Bit High Performance Audio Sigma-Delta D/A Converter

An 18-Bit High Performance Audio Σ-Δ D/A Converter

Parameter Optimization Of Deterministic Dynamic Element Matching Dacs For Accurate And Cost-Effective Adc Testing

Understanding High-Resolution Dynamic Element Matching DACs

A 200 Khz Bandwidth Ea Dac With A Spur Free Modulator

A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations

A 200 KHz Bandwidth ΣΔ DAC with a Spur Free Modulator

Design of a 12 bit High-Stability Digital-to-Analog Converter

A Novel Dynamic Element Match Technique in Current-Steering DAC

A random DEM technique with minimal element transition rate for high-speed DACs

A Novel Dynamic Element Matching Technique In Current-Steering Dac

Binary tree structure random Dynamic Element Matching technique in current-steering DACs

Dynamic Element Matching with Signal-Independent Element Transition Rates for Multibit $\delta\sigma$ Modulators

A 14-bit 300MHz pipelined DEM DAC with enhanced dynamic linearity