Microstructure and mechanical properties of heat-treated GeSb<sub>2</sub>Te<sub>4</sub> thin films

Jianning Ding,Guoxin Xie,Zhen Fan,f u yongzhong,Zhiyong Ling
DOI: https://doi.org/10.1007/s11595-005-2196-6
2007-01-01
Abstract:The effect of annealing on microstructure, adhesive and frictional properties of GeSb2 Te-4 films were experimentally studied. The GeSb2 Te-4 films were prepared by radio frequency (RF) magnetron sputtering, and annealed at 200 degrees C and 340 degrees C under vacuum circumstance, respectively. The adhesion and friction experiments were mainly conducted with a lateral force microscope (LFM) for the GeSb2 Te-4 thin films before and after annealing. Their morphology and phase structure were analyzed by using atomic force microscopy (AFM) and X-ray Diffraction (XRD) techniques, and the nanoindention was employed to evaluate their hardness values. Moreover, an electric force microscope (EFM) was used to measure the surface potential. It is found that the deposited GeSb2 Te-4 thin film undergoes an amorphous-to-fcc and fcc-to-hex structure transition; the adhesion has a weaker dependence on the surface roughness, but a certain correlation with the surface potential of GeSb2 Te-4 thin films. And the friction behavior of GeSb2 Te-4 thin films follows their adhesion behavior under a lower applied load. However, such a relation is replaced by the mechanical behavior when the load is relatively higher. Moreover, the GeSb2 Te-4 thin film annealed at 340 degrees C presents a lubricative property.
What problem does this paper attempt to address?