Abstract:The latest development of ultrafast free electron laser makes it now possible to perform single molecule diffraction imaging. In such an experiment, two-dimensional (2D) diffraction images of randomly oriented molecules of the same type (single molecules) can be captured within femtosecond exposure time. These images can then be used to deduce the 3D structure of the molecule. Two of the most challenging problems that must be solved in order to obtain a high resolution 3D reconstruction are: 1) the determination of the relative orientations of 2D diffraction images; 2) the retrieval of the phase information of a reconstructed 3D diffraction pattern. In this paper, we will focus on the first problem and discuss the use of common curve detection techniques to deduce the relative orientations of 2D diffraction images produced from single-molecule diffraction experiments. Such a technique is based on the fact that Ewald spheres associated with two diffraction images of the same molecule intersect along a common curve in the reciprocal space. By detecting these curves on each diffraction image, we can deduce the relative orientations of diffraction images by solving an eigenvalue problem. When the radius of the Ewald sphere is sufficiently large relatively to the region of reciprocal space we are interested in, the Ewald sphere becomes flat near the origin of the reciprocal space, and common curves reduce to common lines. In this case, the orientation determination problem is similar to the one that arises in single particle cryo-electron microscopy. The recent work of Singer and Shkolnisky [1] shows that the orientation determination problem can be solved by computing the largest eigenvalues of a symmetric matrix constructed from the common lines identified among cryo-EM projection images. In this paper, we will extend their technique to diffraction images on which common curves can be identified.

Orientation relationship, shape change and their traces in electron diffraction patterns and high-resolution transmission electron microscopy images

A two-dimensional analytical approach for phase transformations involving an invariant line strain

Orientation Dependence of Diffraction Intensities from Helical Structures

Diffraction-Based Multiscale Residual Strain Measurements

High Strain Gradient Plasticity Associated with Wedge Indentation into Face-Centered Cubic Single Crystals: Geometrically Necessary Dislocation Densities

Decomposition of the Transformation Displacement Field

Strain Characterization in Two-Dimensional Crystals.

A Method for Accurate Orientation Determination for Rotation Electron Diffraction Patterns

Three dimensional classification of dislocations from single projections

Linking a completely three-dimensional nanostrain to a structural transformation eigenstrain

Shapelet-based orientation and defect identification method for nanostructured surface imaging

Orientation Determination for 3d Single Molecule Diffraction Imaging

Elastic strain mapping of plastically deformed materials by TEM

A New Principle Of Orientation Determination For 3d Electron Diffraction Microscopy

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

Convertion and Its Application of Two Kinds of Discriptions on the Orientation Relationship

Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

A Theoretical Investigation of Orientation Relationships and Transformation Strains in Steels

Reproducible Orientation Relationships Developed from Phase Transformations—Role of Interfaces

Predicting nanocrystal morphology governed by interfacial strain

Determination of precise orientation relationships between surface precipitates and matrix in a duplex stainless steel