A Simple Method for Determination of the Electron Work Function of Different Crystallographic Faces of Copper

W Li,DY Li
DOI: https://doi.org/10.1002/pssa.200305939
2003-01-01
Abstract:The great sensitivity of the electron work function (EWF) to surface microstructure has attracted increasing interest from tribologists and surface scientists. Efforts have been made to investigate wear phenomena involving changes in dislocation density, grain boundary, and texture near surfaces using the Kelvin probing technique. However, the effects of these microstructural parameters on EWF have not been well understood. This has resulted in difficulty in applying the EWF to characterize properly the wear behavior of materials. In this study, a simple approach is proposed to evaluate EWFs of different crystallographic faces and is applied to copper as an example. It is demonstrated that more closely packed faces have higher EWFs. Theoretical results using this approach are consistent with experimental data and theoretical calculations using the first-principle approach. For quantitative evaluation, this approach is significantly simpler than the first-principle treatment and makes it possible to deal with more complicated situations. The proposed approach would be valuable for application of the Kelvin probing technique in tribological studies.
What problem does this paper attempt to address?