Microstructural study of multiferroic HoMnO_3 epitaxial thin films

YU Yi,ZHANG Xiao-zhong,YANG Jun-jie,WANG Jia-wei,ZHAO Yong-gang
2013-01-01
Abstract:Recently,multiferroic hexagonal manganites RMnO3(R=Y,Ho-Lu) has been a hot topic in the area of both condensed matter physics and materials science due to their rich connotation in structure and physical properties.Using transmission electron microscopy,the microstructure of multiferroic HoMnO3 epitaxial thin films grown on yttria-stabilized zirconia(YSZ) substrates was studied.It is shown that high quality c-axis oriented HoMnO3 thin films are successfully grown on YSZ(111) substrates.Major defects in the films are out-of-phase boundaries(OPBs).The formation of OPBs is ascribed to the surface step mechanism and the nucleation layer mechanism.Scanning transmission electron microscopy investigations indicate that the OPBs are off-stoichiometric,either Ho rich or Mn rich.Such off-stoichiometric defects may affect the electrical properties of the films.These findings may be helpful for future thin film growth and further understanding of the correlation of structure and physical properties in hexagonal manganite thin films.
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