Domain Structure and Multiferroic Properties of Epitaxial Hexagonal ErMnO3 Films

Yi Chen,Ye Li,Dongfeng Zheng,Leiyu Li,Min Zeng,Minghui Qin,Zhipeng Hou,Zhen Fan,Xingsen Gao,Xubing Lu,Qiliang Li,Jun-Ming Liu
DOI: https://doi.org/10.1016/j.jallcom.2019.153529
IF: 6.2
2020-01-01
Journal of Alloys and Compounds
Abstract:Epitaxial ErMnO3 thin films were grown on Pt-coated Al O-2(3) substrate by pulsed laser deposition. Their structure, multiferroicity, and ferroelectric domain properties have been comprehensively characterized and studied. The XRD measurement indicated an excellent epitaxy of out-of-plane ErMnO3 (0001)// Pt(111)//Al2O3 (0001) and in-plane ErMnO3 [1000]//Pt[11 (2) over bar]//Al2O3 [11 (2) over bar0] structures. The as-deposited ErMnO3 films exhibited spontaneous ferroelectric domains with reversible polarization. A significant remnant polarization of 1.3 mu C/cm(2) and an active peak at 662 cm(-1) in Raman spectra were found, further showing a high quality of the ErMnO3 thin films. Moreover, the magnetic measurements indicated that the thin film has an excellent anisotropic magnetic property with a Neel temperature at approximate to 53 K. (C) 2019 Elsevier B.V. All rights reserved.
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