Residual Stress Trend in Thermal Barrier Coatings in Through Thickness Direction Measured by Photoluminescence Piezospectroscopy

C. Chen,H. B. Guo,I. P. Shapiro,H. Peng,X. F. Zhao,P. Xiao,S. K. Gong
DOI: https://doi.org/10.1179/174367509x12503626841479
2010-01-01
Advances in Applied Ceramics
Abstract:Photoluminescence piezospectroscopy (PLPS) has been used to determine residual stresses in sapphire, alumina in the yttria stablised zirconia (YSZ)/Al2O3 composite and alumina in thermal barrier coatings (TBCs). The TBC of YSZ containing 0·5 wt-% alumina has been produced using electron beam physical vapour deposition. The stress profile through the TBC thickness was measured using a depth sensing method. Reasonable residual stress profiles have been obtained using PLPS with the confocal system for all three material systems. Measurements of TBCs suggest that stress distribution in a TBC system is not uniform in general. However, uniform stress distribution has been found in some positions where damage in TBCs might occur.
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