The Hierarchical H-Adaptive 3-D Boundary Element Computation Of Vlsi Interconnect Capacitance

Js Hou,Zy Wang,Xl Hong
DOI: https://doi.org/10.1109/ASPDAC.1999.759719
1999-01-01
Abstract:In VLSI circuits with deep sub-micron, the parasitic capacitance from interconnect is a very important factor determining circuit performances such as power and time-delay. The Boundary Element Method(BEM) is an effective tool for solving Laplacian's equation applied in the parasitic capacitance extraction. In this paper, a hierarchical h-adaptive BEM is presented. It constructs a 3-D linear hierarchical shape function based on constant boundary element and uses previous computations and solutions. Hence, it reduces much computation in adaptive procedure. Besides, a combination of residual-type estimator and reduced Z-Z error estimator for more reliable and efficient estimation of error is presented. Some numerical results show that this method is effective.
What problem does this paper attempt to address?