Statistic Analysis of Partial Discharge for High-Voltage Storage Capacitor under DC

BIAN Shan-shan,WU Guang-ning,ZHANG Xue-qin,LI Xiao-hua,PENG qian
DOI: https://doi.org/10.3969/j.issn.1009-9239.2007.05.019
2007-01-01
Abstract:High-voltage storage capacitor is the common device in pulse power system and it is also widely used in weapon.High reliability must be required because of its special used situation.However,the actual evaluation methods can not detect defects in capacitors which do great harm to lifespan of them,some eligible capacitors are breakdown ahead of they regular lifespan.Partial discharge(PD) contains abundant information of dielectric and insulation.The characteristic parameters of PD can reveal insulation inner defects efficaciously.So direct current partial discharge(DCPD) detection was made to capacitor which with single defect.Based on the Delta(t) analysis method,all kinds of two-dimension distributions of DCPD signals and finger-prints for different defects can be got.From these results of statistic analysis,correct pattern recognition to defect types in High-voltage storage capacitor can be obtained.
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