Fault Predict of Analog Circuit Based on Multiple Features Information Fusion

ZHANG Na,LONG Bing,LIU Zhen
DOI: https://doi.org/10.3969/j.issn.1000-8829.2011.12.021
2011-01-01
Abstract:In order to solve the insufficient of fault prediction by using single information and improve prediction accuracy,a method of fusing data to analog circuit fault prediction is proposed,extracting multiple points' various faults characteristics of analog circuits,and carrying on the time series analysis,using ARMA model research on its forecast process,and turning the forecast results into analog circuit faults occur probability.Finally,the gotten data are weighted fusion.Experimental results show that the proposed method overcomes insufficient by using single information,and it's applicable to the hard faults and soft faults that device parameters offset is small,the fault prediction accuracy is high.
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