XRD ANALYSIS OF THE RECRYSTALLIZATION PROCESS OF SHOT PEENED LAYER ON IN SITU TIB2/6351AL COMPOSITE

Luan Weizhi,Jiang Chuanhai,Wang Haowei
DOI: https://doi.org/10.3321/j.issn:0412-1961.2008.06.006
IF: 1.797
2008-01-01
ACTA METALLURGICA SINICA
Abstract:The recrystallization processes of TiB2/6351Al and 6351Al deformation layers introduced by shot peening were investigated. The domain size and microstrain during annealing were calculated from X-ray diffraction line profile analysis. The activation energies of the domain growth and microstrain relaxation were obtained by regression analysis. The results showed that the recrystallization activation energies of the both materials are larger than the aluminum self-diffusion activation energy, and the recrystallization activation energy of composite is slightly larger than that of matrix alloy. Due to the movements of grain and subgrain boundaries were impeded during annealing, the improvement of reinforcements on recrystallization activation energy was weakened.
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