Intrinsic lamellar defects containing atomic Cu in Cu 2 X (X = S, Se) thermoelectric materials
Yuyu Wei,Ping Lu,Chenxi Zhu,Kunpeng Zhao,Xiaoyue Lu,Hong Su,Xun Shi,Lidong Chen,Fangfang Xu
DOI: https://doi.org/10.1039/d1tc00535a
IF: 6.4
2021-01-01
Journal of Materials Chemistry C
Abstract:Intrinsic lamellar defects containing atomic copper have been revealed in Cu 2 X (X = S, Se) materials by structural and chemical analysis at the atomic scale, providing new insight into the investigation of the copper precipitation mechanism.
materials science, multidisciplinary,physics, applied