Research of Film Precise Potentiometer Linearity Automatically Measuring and Amending System

G. L. Wang,Z. H. Liu,X. D. Pan
DOI: https://doi.org/10.4028/www.scientific.net/kem.392-394.79
2008-01-01
Key Engineering Materials
Abstract:This paper researched the film-precision potentiometer resistance, the development of its linear measuring and amending automation system, the application in aerospace field. The system with the X-Y table in the use of self-developed resistance to probe linear measurement, in the computer control of the special carved header of the sophisticated detection of potential amendments to meet the requirements of its linearity error. The entire process of measuring and repair inscribed industrial control computer supported by self-developed special software measurement and repair inscribed automatic, and fully automated, with high precision and high efficiency characteristics.
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