Surface Morphology, Structural and Optical Properties of Polar and Non-Polar ZnO Thin Films: A Comparative Study
R. Deng,B. Yao,Y. F. Li,B. H. Li,Z. Z. Zhang,H. F. Zhao,J. Y. Zhang,D. X. Zhao,D. Z. Shen,X. W. Fan,L. L. Yang,Q. X. Zhao
DOI: https://doi.org/10.1016/j.jcrysgro.2009.07.043
IF: 1.8
2009-01-01
Journal of Crystal Growth
Abstract:The polar and non-polar ZnO thin films were fabricated on cubic MgO (111) and (001) substrates by plasma-assisted molecular beam epitaxy. Based on X-ray diffraction analysis, the ZnO thin films grown on MgO (111) and (100) substrates exhibit the polar c-plane and non-polar m-plane orientation, respectively. Comparing with the c-plane ZnO film, the non-polar m-plane ZnO film shows cross-hatched stripes-like morphology, lower surface roughness and slower growth rate. However, low-temperature photoluminescence measurement indicates the m-plane ZnO film has a stronger 3.31eV emission, which is considered to be related to stacking faults. Meanwhile, stronger band tails absorbance of the m-plane ZnO film is observed in optical absorption spectrum.