Method of Eliminating Parasitic Capacitances in Micro Flow Measurement of MEMS Devices

LI Li-wei,ZHU Rong,ZHOU Zhao-ying,REN Jian-xing
DOI: https://doi.org/10.3969/j.issn.1002-1841.2008.12.039
2008-01-01
Abstract:Parasitic capacitances sometimes tend to be a undesired signal which interfere the output of useful signal during the micro flow measuring of MEMES devices.The generation and the elimination of parasitic capacitances in bicavitary bonding microsensor structure actuated by PZT were analyzed.The theory expression of parasitic capacitance was derived according to the superposition principle and the differentiating circuit theorem.And the response waveform of simulating parasitic capacitance was quite similar to that of measuring.Thus it was determined that the parasitic capacitances were induced between the silicon substrate and the Pt wire where those two cavities were bonded.The elimination method of such parasitic capacitances is presented and proved to be effective by experimental results.
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