The Physical Correlation of Domain-Wall Depinning and Polarization Relaxation in Bi3.53la0.47ti3o12 Thin Film

Y. X. Zhang,A. Q. Jiang,Y. J. Zhang,Y. Y. Lin,T. A. Tang

DOI: https://doi.org/10.1080/10584580701755518

2008-01-01

Integrated Ferroelectrics

Abstract:ABSTRACT A competition between pinning and depinning of domain walls in Bi3.53La0.47Ti3O12 thin films during bipolar-voltage stressing is evidenced from the appearance of one peak in fatigue spectrum (2P r −N) at a frequency of f = 100 Hz. The peak weakens in intensity with increasing fatigue frequency and finally disappears at f > 100 kHz. The area fractions of pinned and depinned domain walls per cycle are extracted from fatigue spectra that both demonstrate an exponential dependence of the pulse duration with a characteristic relaxation time of τ1 = 3 – 9 ms. Consequent measurement of polarization retention in the time scale of magnitude of 10− 6−10− 1s independently gives two relaxation times of 44 μ s and 7.9 ms. The congruent derivation of millisecond-ordered relaxation time from both measurements predicts the kinetics of mutual interactions of domain nuclei with defects at low frequencies.