Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.

Double-peak Fitting of X-ray Diffraction by Voigt Profile Function

Axial nanodisplacement measurement based on the double-helix point spread function generated using radially polarized beams with vortex phase modulation

Direct Method of Determining the Lattice Parameters of a Phase from X-ray Diffraction Pattern of Multi-Phase

An Algorithm for Calculating Diffraction Profiles of 2θ Scans for Multiple Diffraction from Crystals and Thin Films

Step Size, Scanning Speed and Shape of X-ray Diffraction Peak

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

On the Peak Shapes of X-Ray Micro Diffraction.

The Physical Meanings of 5 Basic Parameters for an X-ray Diffraction Peak and Their Application

A Peak Position Comparison Method for High-Speed Quantitative Laue Microdiffraction Data Processing

Distinguishing and Further Reinforcement for Nanocrystal XRD Peaks Caused by Instrument Broadening in Nanomixed Materials

Characteristics of Friedel Pairs and Diffraction Contrast Tomography with Non-Perpendicular Rotation Axis

An alternative method to the Takagi-Taupin equations for studying dark-field X-ray microscopy of deformed crystals

Application of X-Ray Dual Crystal Diffraction in Semiconductor Materials and Structure Analysis

Data smoothing and distortion of X-ray diffraction peaks. II. Application

High-Throughput Powder Diffraction Using White X-Ray Beam and a Simulated Energy-Dispersive Array Detector

Combined Texture and Microstructure Analysis of Deformed Crystals by High-Energy X-ray Diffraction

Direct structure depth profiling of polycrystalline thin films by X-ray diffraction and its application

Data Smoothing and Distortion of X-ray Diffraction Peaks. I. Theory

A Method for Interpolating Asymmetric Peak Shapes in Multiplet Γ-Ray Spectra

Polynomial Curve Fitting Method for Refraction-Angle Extraction in Diffraction Enhanced Imaging

Quantitative Analysis of a Textured Coating by a New X-Ray Diffraction Method