Abstract:Although the fundamental, theoretical peak shape in X-ray photoelectron spectroscopy (XPS) is Lorentzian, some Gaussian character is observed in most XPS signals. Additional complexity in the form of asymmetry is also found in many XPS signals, which requires more advanced peak shapes than the traditional, symmetric Voigt and Gaussian-Lorentzian sum and product (pseudo-Voigt) functions. Here, we discuss the merits and disadvantages of four approaches that have been used to introduce asymmetry into XPS peak shapes: addition of a decaying exponential tail to a symmetric peak shape, the Doniach-Sunjic peak shape, the double-Lorentzian, DL, function, and the LX peak shapes, which include the asymmetric Lorentzian (LA), finite Lorentzian (LF), and square Lorentzian (LS) functions. The Doniach-Sunjic peak shape is the only asymmetric, synthetic peak that has a theoretical basis. However, it has an infinite integral, which makes it problematic in quantitative work. The mathematical bases for the LX and DL peak shapes are discussed, and practical examples of their use in peak fitting are presented. The case is made for the Voigt function being the most appropriate function for XPS peak fitting, in general, which suggests that a modified Voigt function may be the most reasonable for fitting asymmetric XPS signals. The LX and DL functions include convolution with a Guassian, which, with the exception of the LS function, makes them Voigt-like functions. The sources of asymmetry and its complexity are discussed. It is emphasized that not every asymmetric spectrum should be fit with an asymmetric peak shape.

Data Smoothing and Distortion of X-ray Diffraction Peaks. I. Theory

Data smoothing and distortion of X-ray diffraction peaks. II. Application

The Surface Smoothing Methods for Three-Dimensional Fluorescence Spectrometry Based on Savitzky-Golay Polynomial Smoothing

Distortion Correction in Surface Defects Evaluating System of Large Fine Optics

Step Size, Scanning Speed and Shape of X-ray Diffraction Peak

The Physical Meanings of 5 Basic Parameters for an X-ray Diffraction Peak and Their Application

Smoothing Algorithms and High-order Singularities in Gravitational Lensing

A discussion of approaches for fitting asymmetric signals in X‐ray photoelectron spectroscopy (XPS), noting the importance of Voigt‐like peak shapes

Surface science insight note: Optimizing XPS instrument performance for quantification of spectra

Lattice symmetry relaxation as a cause for anisotropic line broadening and peak shift in powder diffraction

A Simple Calibration Method to Consider Plastic Deformation Influence on X-ray Elastic Constant Based on Peak Width Variation

Distinguishing and Further Reinforcement for Nanocrystal XRD Peaks Caused by Instrument Broadening in Nanomixed Materials

A General Approach for Multidimensional Smoothing

Influence of spectral dispersion parameters on the beam smoothing performance of a diffractive optical element

The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method

Statistic Analysis Of Influence Of Phase Distortion On Diffractive Optical Element For Beam Smoothing

Spatial Frequency Analysis of Beam Smoothing Performance Realized by the Diffractive Optical Element and the Smoothing by Spectral Dispersion Technique

Locally Self-Adjustive Smoothing for Measurement Noise Reduction with Application to Automated Peak Detection

Monochromator-Induced Glitches In Exafs Data .1. Test Of The Model For Linearly Tapered Samples

Smooth unfolding algorithm for soft X-ray Dante spectrometer andits application to Z-pinch diagnostic