Structure, spectral analysis and microwave dielectric properties of novel x(NaBi)0.5MoO4-(1-x)Bi2/3MoO4 (x = 0.2 ∼ 0.8) ceramics with low sintering temperatures
Shu-Zhao Hao,Di Zhou,Fayaz Hussain,Wen-Feng Liu,Jin-Zhan Su,Da-Wei Wang,Qiu-Ping Wang,Ze-Ming Qi,Charanjeet Singh,Sergei Trukhanov
DOI: https://doi.org/10.1016/j.jeurceramsoc.2020.03.074
IF: 5.7
2020-08-01
Journal of the European Ceramic Society
Abstract:Herein, the x(NaBi)0.5MoO4-(1-x)Bi2/3MoO4 (xNBM-(1-x)BMO, x = 0.2 ∼ 0.8) microwave dielectric ceramics with low sintering temperatures were prepared via the traditional solid-state method to adjust the τ f value and dielectric constant. The crystal structure was determined using X-Ray diffraction and Raman spectroscopy, the microstructure was investigated using scanning electron micrograph and energy disperse spectroscopy, and the dielectric properties were studied using a network analyser and infrared spectroscopy. For the xNBM-(1-x)BMO composite ceramics, the (NaBi)0.5MoO4 tetragonal phase coexisted with the Bi2/3MoO4 monoclinic phase. With the rise of x value, the permittivity increased from 23.7–29.8, and the τ f value shifited from -53.3 ppm/°C to -13.7 ppm/°C. The 0.8NBM-0.2BMO ceramic sintered at 680 °C possessed excellent microwave dielectric properties with a εr = 29.8 (6.7 GHz), a Qf = 11,800 GHz, and a τ f = -13.7 ppm/°C. These results made the xNBM-(1-x)BMO composite ceramics great candidates in low temperature co-fired ceramics technology.
materials science, ceramics