Use of Microwave Plasma Torch Atomic Emission Spectrometry for the Determination of Silicon

Feng Liang,Hanqi Zhang,Qun Jin,Daxin Zhang,Yahu Lei,Qinhan Jin
DOI: https://doi.org/10.1007/s002160050174
1997-01-01
Abstract:A method for the elimination of matrix effects was developed for the determination of trace amounts of silicon by microwave plasma torch atomic emission spectrometry (MPT-AES). The sample solution was introduced into the MPT with a pneumatic nebulizer (PN). When Ar was used as both carrier and support gas, a detection limit of 10.8 ng/ml was obtained. The precision was 4.2% (RSD). The characteristics of the emission spectrum of silicon in MPT was studied in detail. The interference of some concomitant cations with the silicon emission was eliminated by incorporation of a cation-exchange column into the flow injection system. The method has been applied to analyze some practical samples and the results obtained are satisfactory.
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