Abstract:The cost effectiveness of fault detection and isolation techniques used in complex systems is paid more attention in nowadays. Well design for testability (DFT) can save cost in fault detection and isolation, assure adequate failure coverage by Built-In Test (BIT) and Automatic Test Equipment (ATE), reduce false alarms, and reduce maintenance training requirements. However, there are limited intelligent approaches implemented and applied for DFT for integrated diagnostics. Meanwhile, different tools for DFT are incompatible with each other. This phenomenon has prevented testability engineering from integrating into system engineering. The paper promotes a general-purpose graph and information based intelligent approach to DFT supporting concurrent system engineering. Testability models, including information flow model, multi-signal flow model, hybrid dependency model, etc, can all be described by a graph theory core with information attached. Meanwhile, intelligent algorithms are imported to solve complex testability inference problems, most of which are NP problems. The testability figures of merit (TFOMs) defined in IEEE 1522 are adopted to standardize the quantitative parameters to assess the testability level. An intelligent DFT framework is constructed according to AI-ESTATE to realize artificial intelligent information exchanges. The graph and information based intelligent approach is shown to be efficient and effective to realize advanced DFT of complex large systems. The transitive closure algorithm and the logical closure algorithm given in the paper is verified by the example of an electronic equipment with 4 test items and 5 fault modes. The genetic algorithms (GAs) based fault detection rate (FDR) allocation method is applied in a 3 layers' certain electronic system composed of 6 subsystems. By comparing with experience and fault rate based TFOMs allocation method, GAs is shown to be more adaptive and efficiency. © 2011 IEEE.

GLOBAL: A Design for Random Testability Algorithm

Design and implementation of a PCB testing system

The Algorithm and Implementation of a Universal PCB Testing System

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis

A Method for Assessing the Performance of Genetic Algorithm Optimization for Water Distribution Design

Design of Test Points Selection and Test Sequencing Problem of Multivalued Fault Dictionary

Non-Scan Design For Testability For Synchronous Sequential Circuits Based On Fault-Oriented Conflict Analysis

Register assignment algorithm targeting automatic test pattern generation

Non-scan testability based on fault-oriented conflict analysis

A General Enhancement Method for Test Strategy Generation for the Sequential Fault Diagnosis of Complex Systems

Two Topological Problems and Their Solutions in Testability

Adaptive Random Testing by Exclusion Through Test Profile

An Algorithm for Fault Diagnosis Based on Combinatorial Design Approach for Testing

Adaptive Random Test Case Generation for Combinatorial Testing

High level register allocation algorithm based on testability analysis

Application Of Rollout Strategy To Test Points Selection For Integer-Coded Fault Wise Table

A Test Scheduling Algorithm Based on Two-Stage Ga

Selection of Global Minimal Test Points Set for Integer-Coded Fault Wise Table

Efficient Global Search for Inputs Triggering High Floating-Point Inaccuracies

Graph and information based intelligent design for testability

Simplified Entropy and Multidimensional Search for Test Points Selection