MBE Growth and STM Analysis of Surface Morphology and Reconstructions of InAs Films

WANG Jihong,LUO Zijiang,ZHOU Xun,ZHANG Bichan,GUO Xiang,DING Zhao
DOI: https://doi.org/10.3969/j.issn.1005-023x.2013.04.024
2013-01-01
Abstract:InAs films were prepared on InAs(001) substrate by utilizing the molecular beam epitaxy(MBE) technology.During the growth process of InAs films,reflection high energy electron diffraction(RHEED) intensity oscillations and patterns were used to measure and monitor the real-time growth rate and status.After growth and subsequent annealing,the sample was quenched down to room temperature then transferred into scanning tunneling microscope(STM) for observation.STM images confirmed that the surface morphology of this sample was atomically flat.Combined the RHEED patterns with STM images,it is speculated that the surface reconstruction of InAs films was mixture of β2(2×4) and α2(2×4).
What problem does this paper attempt to address?