Abstract:Establishing an effective testability model is key to testability design and fault diagnosis. Under the general assumptions that test circuits are completely reliable and all test signals can be accurately transmitted to display devices, traditional testability modelling methods are effective. However, these assumptions cannot hold for many practical applications, thereby eventually leading to incorrect fault diagnosis results. To overcome these problems, a novel extended testability modelling method that considers the supporting relation between faults and tests (SRFT) is presented. The blocking and enabling relations between faults and tests are analysed from the perspective of test information transmission and test failure. Accordingly, the element design, mathematical expression, and model type design were elaborated in detail. A matrix fusion algorithm and a diagnosis knowledge construction algorithm are proposed herein to express the supporting relation in a diagnostic matrix, wherein the third state of the test is introduced to describe the test failure. According to the supporting relation information in the diagnostic matrix, three new testability indices are proposed to evaluate the system testing capability. Our case study results clearly demonstrate the superiority of the proposed method, which can accurately describe the supporting relation and help obtain accurate diagnostic results.

The Test Selection Algorithms Based on Boolean Logic

An Improved Test Selection Optimization Model Based on Fault Ambiguity Group Isolation and Chaotic Discrete PSO.

Towards Selecting Test Data Using Topological Structure of Boolean Expressions

A Detectability Analysis of Fault Classes for Boolean Specifications

Exploring Topological Structure of Boolean Expressions for Test Data Selection

Fault Class Prioritization in Boolean Expressions

Comparing Fault-based Testing Strategies of General Boolean Specifications

Board-level Functional Test Selection Based on Fault Tree Analysis

Joint Distribution-Based Test Selection for Fault Detection and Isolation Under Multiple Faults Condition

A Novel Logic Detection Algorithm for Logic Circuits

Test Case Generation for Boolean Expressions by Cell Covering

An Improved Model-Based Method to Test Circuit Faults

A novel approach of test case generation for Boolean specification

Software fault diagnosis method based on combinatorial testing

Novel Testability Modelling and Diagnosis Method Considering the Supporting Relation Between Faults and Tests

Comparing Logic Coverage Criteria on Test Case Prioritization

Selection of Global Minimal Test Points Set for Integer-Coded Fault Wise Table

Simplified Entropy and Multidimensional Search for Test Points Selection

Test Points Selection for Analog Fault Dictionary Techniques

Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

Improved Algorithm for Test Case Selection Based on Operational Profiles