A Combinatorial Testing-Based Approach to Fault Localization
Laleh Sh Ghandehari,Yu Lei,Raghu Kacker,Richard Kuhn,Tao Xie,David Kung
DOI: https://doi.org/10.1109/tse.2018.2865935
IF: 7.4
2020-01-01
IEEE Transactions on Software Engineering
Abstract:Combinatorial testing has been shown to be a very effective strategy for software testing. After a failure is detected, the next task is to identify one or more faulty statements in the source code that have caused the failure. In this paper, we present a fault localization approach, called BEN, which produces a ranking of statements in terms of their likelihood of being faulty by leveraging the result of combinatorial testing. BEN consists of two major phases. In the first phase, BEN identifies a combination that is very likely to be failure-inducing. A combination is failure-inducing if it causes any test in which it appears to fail. In the second phase, BEN takes as input a failure-inducing combination identified in the first phase and produces a ranking of statements in terms of their likelihood to be faulty. We conducted an experiment in which our approach was applied to the Siemens suite and four real-world programs, flex, grep, gzip and sed, from Software Infrastructure Repository (SIR). The experimental results show that our approach can effectively and efficiently localize the faulty statements in these programs.