The Electrical Measurement System of Nanodevices Based on Virtual Instrument

梁涛,朱玉振,李成垚,魏贤龙,梁学磊,高崧,陈清
DOI: https://doi.org/10.3321/j.issn:0479-8023.2008.06.008
2008-01-01
Abstract:Based on virtual instrument technology,automatic measurement systems for measuring I-V curve and differential conductance were realized.In order to depress the noise,a lock-in differential conductance measurement system is designed.The data acquisition,processing and analyzing are carried out by using Measurement Studio development tool.The test results indicate that the system has very high precision and reliability.An application of the measurement system is demonstrated which measures a single carbon nanotube inside a scanning electron microscope combining with a nanoprobe system.
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