Stress singularities along a cycloid rough surface

chiu chenghsin,gao huajian

DOI: https://doi.org/10.1016/0020-7683(93)90208-O

IF: 3.667

1993-01-01

International Journal of Solids and Structures

Abstract:The stress concentration along a rough surface is of importance for understanding the nucleation of misfit dislocations and cracks in heteroepitaxial thin films and for general flaw initiation at material surfaces exposed to environmental corrosion. In order to seek a basic understanding on this issue, a cycloid wavy surface subject to a uniform bulk stress is adopted as a model problem. The elastic stress and displacement fields are determined using Muskhelishvili's conformal mapping method. It is shown that a cusped cycloid surface generates a crack-like singular stress field within a thin surface layer; under uniform tension this singularity is found to have identical strength to a row of periodic parallel cracks. The path-independent J-integral requires that the average surface strain energy density be identical to that in the bulk, implying that any stress magnification along a rough surface must be compensated by unloading along some complementary portions of the surface. Along the cusped cycloid surface, the strain energy distribution becomes Dirac singular at the cusp tips, the rest of the surface being completely stress-free. Thus the effect of cycloid cusps is to redistribute and concentrate all the surface strain energy per wavelength at a single (cusp) point, and because of that we can claim that the cycloid surface is the most efficient stress concentrator at a fixed wavelength. Even at a moderate bulk stress level this concentration may be sufficient to cause failure or nucleation of defects.