The Microstructural Studies of Hydrogenated Amorphous Carbon Films by Raman Spectra

GX CHENG,SL GU,YL HE,ZH WANG,H XIA,W ZHANG,XK ZHANG
DOI: https://doi.org/10.1002/pssa.2211390219
1993-01-01
Abstract:Raman measurements on hydrogenated amorphous carbon are performed in order to complete a comprehensive view of the carbon matrix disorder in a-C:H films. Hydrogenated amorphous carbon films are prepared by rf glow discharge. The changes in their microstructures due to the content of methane, the substrate bias voltage, and deposition fractional pressure are investigated using Raman scattering. These results reveal that the films tend to have a microcrystalline structure, the hydrogenation of the films is decreased corresponding to this structure change. The Raman scattering from amorphous carbon films shows several features, which are attributed to microcrystalline graphite-like structures which all originate from the same region in the samples, the microcrystalline average domain size is obtained, too.
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