Structural Characterization Of Cubic Silicon Nitride

Jz Jiang,K Stahl,Rw Berg,Dj Frost,Tj Zhou,Px Shi
DOI: https://doi.org/10.1209/epl/i2000-00337-8
2000-01-01
Europhysics Letters
Abstract:Structural characterization of the third polymorph of silicon nitride, synthesized under high-pressure and high-temperature conditions, has been obtained by Rietveld structure refinements of X-ray powder diffraction data recorded using synchrotron radiation. The material has a cubic spinel structure at 295 K with a space group Fd-3m, Z = 8, a unit cell of a = 7.7339+/-0.0001 Angstrom, nitrogen position x = 0.2583+/-0.0001, and density rho = 3.75+/-0.02 g cm(-3) The complete structural data obtained should offer a firm basis for understanding the properties of the novel material. One example is present for the Raman spectroscopy data of the material.
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