HREM study of atomic image of single crystal indium phosphide

Wang Lu Chun,Feng Duan,Tan Ke Min,Chen Jun,Yian Yong

DOI: https://doi.org/10.1007/BF02385403

IF: 4.5

1989-01-01

Journal of Materials Science

Abstract:This paper reports some experimental results of high resolution electron microscopy (HREM) studies on single crystal indium phosphide (InP) along the [0 0 1] zone axis. Using 400 kV electrons, with defocus value about 46.0 nm, the optimum conditions for structure imaging for both In and P atoms were found to be about 26.0 nm. Decreasing the specimen thickness to about 15.0 nm, only atomic images of P remain; increasing the specimen thickness to about 37.0 nm, only atomic images of In remain. These experimental results are in good agreement with computer simulation. It was also observed that for bent crystal deviating from the [0 0 1] axis, the bright spots, corresponding to In and P atomic columns in high resolution structure imaging, are elongated at a deviation angle equal to 0.18 degrees, the two bright spots are connected together along the direction of the [1 1 0] zone axis. This phenomenon is also confirmed by computer simulation. In the experiment, a pair of dislocation waves were observed with apparent Burgers vectors of $$\tfrac{1}{2}[0 1 0]$$ and $$\tfrac{1}{2}[0 \bar 1 0]$$ while the actual Burgers vectors may be $$\tfrac{1}{2}[0 11]$$ and $$\tfrac{1}{2}[0 \bar 1\bar 1]$$ .