Microwave Measurement of Energy Gap and Penetration Depth of MgB2 Thin Film

BB Jin,N Klein,A Pimenov,A Loidl,SI Krasnosvobodtsev,WN Kang,HJ Kim,EM Choi,SI Lee
DOI: https://doi.org/10.1016/s0921-4534(02)00993-0
2002-01-01
Abstract:Using a dielectric resonator technique the magnetic field penetration depth λ and the energy gap Δ of two MgB2 thin films were determined by measuring changes of resonance frequency with temperature. The exponential temperature dependence of λ is revealed at low temperatures (TTc/2) the temperature dependence of λ can be well fitted by λ0/[1−(T/Tc)2]1/2. Our results strongly support the absence of nodes in the gap and a possible multigap scenario.
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