Wrapper scan chain balance algorithm based on auto-section of deviation from mean
Deng Libao,Yu Yang,Jiang Lijun
DOI: https://doi.org/10.3969/j.issn.0254-3087.2013.06.008
2013-01-01
Abstract:IP core wrapper scan chain balance design is one of the critical methods to reduce the SoC test time.There are already many scan chain balance design algorithms,such as BFD,MVA,MVAL and so on.However,these methods all assign the scan chains once,which easily sink into the dead zone of assignment.Meanwhile,in the existing methods,the MVA method uses the mean value of wrapper scan chains to predict and control the result,and can obtain more balanced results than other existing methods.However,when the internal scan chains have great dispersion,MVA method is disabled to the core and the obtained result is degraded.Aiming at these problems,the improvements are performed as follows:the scan chains are split into parts that are easy to assign,then the average of each section is used to realize the optimal reconstruction of the internal scan chain again,and the balanced assignment can be realized easier.Based on above,a wrapper scan chain balance design method based on auto-section of deviation from mean(ADM) is proposed.The ADM algorithm primarily includes four processes.Firstly,the scan chain is segmented automatically according to the scan chain length section.Next,for each section,the scan chain length that is closest to the mean of all scan chains is taken as the average,and with this average the deviation from the mean of this scan chain is calculated.Thirdly,to the average value of each section of the scan chain,the first assignment is performed.Lastly,the deviations from the means of all the sections are combined and resorted,and then the second assignment is performed.The proposed method can flexibly assign the scan chains according to their feature.Simulation results for the embedded cores from the ITC'02 SoC Test Benchmarks show that this algorithm can obtain more balanced results than other existing methods.