Abstract:One of the most important limitations of the atomic force microscopy (AFM) is scanning speed, whose high values are required for contemporary high-resolution, long-range diagnostic applications. The measurement bandwidth of an AFM depends on several factors, but usually results from the time constant of the oscillating cantilever, which is correlated with its resonance frequency and quality factor. We propose a method to overcome this problem by performing the surface measurements when the cantilever is vibrating in higher eigenmodes. In this paper we demonstrate the application of active piezoresistive cantilevers operating in this mode. The active piezoresistive cantilever comprises a piezoresistive deflection sensor, a deflection actuator and a nanotip. It is a complete micro-electro-mechanical system (MEMS), ensuring the highest reliability of cantilever vibration control and detection. Higher eigenmode operations are usually difficult to implement as they usually result in lower deflection and lower sensitivity of the probe vibration deflection. Here we present an experimental modification of the structure of an active piezoresistive cantilever using focused ion beam (FIB) machining that mitigates both weaknesses. This has enabled the cantilever to scan the surface at a scanning rate of 10 lines/s with a maximum speed of 500 μm/s and a data acquisition rate of 10 kS/s, when the probe is vibrating at 380 kHz in the second eigenmode. We also describe a traceable calibration routine (based on analysis of the response of the piezoresistive detector, the output of the HeNe interferometer and precise control of the deflection actuator), together with the cantilever modification process and the development of the measurement setup. We show measurement results of dedicated calibration samples and silicon carbide crystal lattice references.

Afm with the Slope Compensation Technique for High-Speed Precision Measurement of Micro-Structured Surfaces

Towards High Accuracy Surface Profile Characterization in Atomic Force Microscopy

Surface Profile Measurement of Micro-Optics by Using a Long Stroke Atomic Force Microscope

Fast Surface Measurement Using Wavelength Scanning Interferometry with Compensation of Environmental Noise

Vibration Compensating Beam Scanning Interferometer for Surface Measurement

Rapid Measurement Of A High Step Microstructure With 90 Degrees Steep Sidewall

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Note: Symmetric Modulation Methodology Applied In Improving The Performance Of Scanning Tunneling Microscopy

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On-machine Measurement of a Slow Slide Servo Diamond-Machined 3D Microstructure with a Curved Substrate

Nonlinear Analysis and Dynamic Compensation of Stylus Scanning Measurement with Wide Range

Application of active piezoresistive cantilevers in high-eigenmode surface imaging

A Novel Atomic Force Microscope with High Stability and Scan Speed

A Vibration Compensation Method Based on White-light Wavelength Scanning Interferometry

Evaluation on Ground Surface Accuracies of Large-Depth and Steeply Micro-Structured SiC Surfaces

Composite scanning and position decoupling method of confocal profilometer for measuring large aperture optical surfaces

Fast Measurement of Surface Topographies Using a Phase-Measuring Deflectometric Microscopy

Novel method for two-coordinate slope test with fiber optic sensor

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Development of an on-machine measurement system for ultra-precision machine tools using a chromatic confocal sensor

Large-Scale and Non-Contact Surface Topography Measurement Using Scanning Ion Conductance Microscopy and Sub-Aperture Stitching Technique