Local Near-Field Enhancement of Random Sb-Sin Films

DR Ou,J Zhu,RJ Zhu,J Wang
DOI: https://doi.org/10.1364/ao.43.003073
IF: 1.9
2004-01-01
Applied Optics
Abstract:Local near-field enhancement of random Sb-SiN films has been studied. Specimens consisting of a random Sb-SiN film and an optical recording layer were prepared and exposed to a focused laser beam. Laser-induced ablation occurred on the recording layer adjacent to random Sb-SiN film much faster and at much lower power than on a single recording layer. These results indicate that an optical field can be enhanced by random Sb-SiN films. The enhanced field was subsequently investigated by scanning near-field optical microscopy, and the pictures revealed that the enhanced field was localized.
What problem does this paper attempt to address?