Abstract:Carbon and silicon materials are two of the most important materials involved in the history of the science and technology development. In the last two decades, C and Si nanoscale materials, e.g., carbon nanotubes, graphene, and silicon nanowires, and quantum dots, have also emerged as the most interesting nanomaterials in nanoscience and nanotechnology for their myriad promising applications such as for electronics, sensors, biotechnology, etc. In particular, carbon and silicon nanostructures are being utilized in energy-related applications such as catalysis, batteries, solar cells, etc., with significant advances. Understanding of the nature of surface and electronic structures of nanostructures plays a key role in the development and improvement of energy conversion and storage nanosystems. Synchrotron soft X-ray absorption spectroscopy (XAS) and related techniques, such as X-ray emission spectroscopy (XES) and scanning transmission X-ray microscopy (STXM), show unique capability in revealing the surface and electronic structures of C and Si nanomaterials. In this review, XAS is demonstrated as a powerful technique for probing chemical bonding, the electronic structure, and the surface chemistry of carbon and silicon nanomaterials, which can greatly enhance the fundamental understanding and also applicability of these nanomaterials in energy applications. The focus is on the unique advantages of XAS as a complementary tool to conventional microscopy and spectroscopy for effectively providing chemical and structural information about carbon and silicon nanostructures. The employment of XAS for in situ, real-time study of property evolution of C and Si nanostructures to elucidate the mechanisms in energy conversion or storage processes is also discussed.

X-Ray Absorption Spectroscopy Study on Nanowires and Nanotubes of Carbon and Silicon

6 Nm Super-Resolution Optical Transmission and Scattering Spectroscopic Imaging of Carbon Nanotubes Using a Nanometer-Scale White Light Source

Near-Edge X-Ray Absorption Fine Structure Spectroscopy As A Tool for Investigating Nanomaterials

A X-ray ABSORPTION spectroscopy and X-ray excited optical luminescence study of silicon nanowires

Super-resolution Hyper-Spectral Imaging for the Direct Visualization of Local Bandgap Heterogeneity

Near-infrared Fluorescence Spectroscopy of Single-Walled Carbon Nanotubes and Its Applications

True-color real-time imaging and spectroscopy of carbon nanotubes on substrates using enhanced Rayleigh scattering

Spectral Research on Phonons of Single-wall Carbon Nanotubes

Optical Micro-Characterization of Single-Walled Carbon Nanotubes Extracted from AFI Crystals by Visible Emission and Raman Scattering

Spectroscopy of the Electronic Transitions of Individual Carbon Nanotubes of Defined Crystal Structure

Studies of Carbon Nanotubes and Fluorinated Nanotubes by X-ray and Ultraviolet Photoelectron Spectroscopy

Synchrotron Soft X-Ray Absorption Spectroscopy Study Of Carbon And Silicon Nanostructures For Energy Applications

Probing Electronic Transitions in Individual Carbon Nanotubes by Rayleigh Scattering.

Optical Spectroscopy of Individual Single-Walled Carbon Nanotubes

Near-Field Optical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes on Substrates

X-Ray Absorption Spectroscopy Study of Graphite and Contaminated Single Wall Carbon Nanotubes Using Surface Annealing Treatment

Probing Nano-Structures Using Rayleigh Scattering with Supercontinuum Radiation

Optical visualization and polarized light absorption of the single-wall carbon nanotube to verify intrinsic thermal applications

Electronic Raman Scattering in Suspended Semiconducting Carbon Nanotube.

Probing Quantum Confinement of Single-Walled Carbon Nanotubes by Resonant Soft-X-Ray Emission Spectroscopy