Failure of BGA lead-free solder joints under random vibration loading

LIU Fang,MENG Guang,WANG Wen
DOI: https://doi.org/10.3969/j.issn.1000-3835.2011.06.054
2011-01-01
Abstract:Non-contact laser holography exciting approach was adopted to conduct experimental modal analysis of a printed circuit board(PCB) assembly and find its dynamic characteristics.Then,its first-order natural frequency was used as the central frequency,and three different acceleration power spectral density(PSD) amplitudes of narrow-band random vibration fatigue tests were respectively carried out.Subsequently,failed BGA solder joints were cross-sectioned and metallurgical analysis was done to investigate failure mechanisms of BGA lead-free solder joints under random vibration loading.The results showed that failure mechanisms of BGA lead-free solder joint vary as the PSD amplitude increases;solder joint failure locations changes from the solder bump body of the PCB side to the solder ball neck,finally to the Ni / intermetallic compound(IMC) interface of the package side;the corresponding failure modes change from fatigue fracture to brittle fracture.
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