Nanoscale Polarization Relaxation of Epitaxial BiFeO3 Thin Film

Weigang Chen,Lu You,Gaofeng Chen,Ngeah Theng Chua,Ong Hock Guan,Xi Zou,Junling Wang,Lang Chen
DOI: https://doi.org/10.1016/j.tsf.2010.03.089
IF: 2.1
2010-01-01
Thin Solid Films
Abstract:The polarization relaxation phenomenon in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pattern. The nucleation of reversed domains followed by domain wall propagation and domain coalesce was observed during relaxations. The polarization relaxation follows a stretched exponential model f=1−e−k(t−t0)n with parameters t0=2894s, n=0.50 and k=6.04e−4. Local polar defects act as nucleation centers and the time-dependent depolarization field is the driving force for polarization relaxation.
What problem does this paper attempt to address?