The Spatial Phase-Shifting Measuring Profilometry Based on Dual-Frequency Grating
Haihua An,Yiping Cao,Haitao Wu,Hechen Zhang,Hongmei Li
DOI: https://doi.org/10.1016/j.optlaseng.2021.106638
IF: 5.666
2021-01-01
Optics and Lasers in Engineering
Abstract:A real-time three-dimensional(3D) shape measuring method based on dual-frequency spatial phase-shifting measuring profilometry (SPSMP) is proposed. To combine the low-frequency and high-frequency gratings into one single composite pattern, each individual grating is modulated along orthogonal direction with a distinct carrier frequency. Since the spectrum components are staggered in the spectrum of the composite deformed pattern, the low-frequency and high-frequency deformed patterns with background light can be demodulated easily. Then two groups of spatial phase-shifting deformed sub-patterns are extracted from the corresponding deformed patterns to calculate the low-frequency wrapped phase and the high-frequency wrapped phase. According to the dual-frequency phase unwrapping algorithm, the high-frequency wrapped phase is guided by the low-frequency unwrapped phase. Compared to the existing multi-frequency single-shot fringe projection, the filtering process of the proposed method is more concise, it does not involve multiple filtering and the extraction of the single spectrum component. The static and real-time experimental results show that the proposed method inherits the high accuracy of PMP, while guaranteeing single-shot feature.