Study of the Energy Release Region of a Heavy-Ion Flux in Nanomaterials by X-ray Spectroscopy of Multicharged Ions

V. P. Efremov,S. A. Pikuz,A. Ya. Faenov,O. Rosmej,I. Yu. Skobelev,A. V. Shutov,D. H. H. Hoffmann,V. E. Fortov
DOI: https://doi.org/10.1134/1.1951012
2005-01-01
JETP Letters
Abstract:X-ray spectroscopic data are reported on the state of a silicon aerogel medium (SiO 2 ) irradiated by a Ni ion flux with an energy of 4.7 MeV/nucleon. Radiation from the electron transitions to the K shell in multicharged Si ions is detected with spatial resolution along the direction of the beam propagation in the medium. Calculations performed for the ionization state and population of the levels excited in the silicon atoms of the target provide the estimate T e = 70–120 eV for the medium electron temperature in the ion tack region. Two-dimensional hydrodynamic calculations provide the estimate T e = 60–116 eV for the same conditions and densities of 0.5–2.5 g/cm 3 of the excited target medium.
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