Multiple ionization of neon by soft x-rays at ultrahigh intensity

R Guichard,M Richter,J-M Rost,U Saalmann,A A Sorokin,K Tiedtke

DOI: https://doi.org/10.1088/0953-4075/46/16/164025

2013-08-13

Abstract:At the free-electron laser FLASH, multiple ionization of neon atoms was quantitatively investigated at photon energies of 93.0 and 90.5 eV. For ion charge states up to 6+, we compare the respective absolute photoionization yields with results from a minimal model and an elaborate description including standard sequential and direct photoionization channels. Both approaches are based on rate equations and take into account a Gaussian spatial intensity distribution of the laser beam. From the comparison we conclude that photoionization up to a charge of 5+ can be described by the minimal model which we interpret as sequential photoionization assisted by electron shake-up processes. For higher charges, the experimental ionization yields systematically exceed the elaborate rate-based prediction.

optics,physics, atomic, molecular & chemical