Inversion of Thicknesses of Multi-Layered Structures from Eddy Current Testing Measurements.

Huang Ping-jie,Wu Zhao-tong
DOI: https://doi.org/10.1007/bf02839318
2004-01-01
Journal of Zhejiang University SCIENCE A
Abstract:Luquire et al.'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.
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