Fourier and wavelet transform analysis of moire fringe patterns in electronic packaging

C. Y. Xiong,J. Zhang,M. Li,J. Fang,S. Yi

DOI: https://doi.org/10.1108/13565360410532024

IF: 0.942

2013-01-01

Microelectronics International

Abstract:In this paper, two transform methods, the Fourier transform (FT) and the wavelet transform (WT) methods, are utilized to process moire fringes for the strain analysis of electronic packaging. With the introduction of fringe carriers, those transform techniques need only one fringe pattern for each deformation state. The strain modulation to the carrier frequency can be subtracted by filtering as the pattern is transformed into spectrum domain by the fast-FT processing, and the deformation field can thus be restored by the inverse FT transform after spectral shifting. The WT method expands the pattern information involved in the fringe carrier in both spatial domain and spectral domain to analyze the deformation distribution in this combined space. By changing the transform scales in the processing, the wavelet transform offers multi-resolution analysis for the deformation field with high gradients.