Abstract:Oftentimes, the power dissipation during the test mode far exceeds the power ratings of the normal operation mode. Hence, there is a need to reduce power during the test mode so that power ratings are not violated and chips do not get burnt during the application of test. Power consumption during built-in-self-test (BIST) operation can be minimized while achieving high fault coverage. Simple measures of observability and controllability of circuit nodes are proposed based on primary input signal probability (probability that a signal is logic ONE). Such measures help determine the testability of a circuit. We developed a tool, POWERTEST, which uses a genetic algorithm based search to determine optimal probability sets (signal probabilities or input signal distribution) at primary inputs to tradeoff test time versus power dissipation and fault coverage. The inputs conforming to the primary input probability-activity sets can be generated using cellular automata or linear feedback shift register (LFSR). We observed that a single input distribution (or weights) may not be sufficient for some random-pattern resistant circuits, while multiple distributions consume larger area. As a tradeoff, two distributions have been used in our analysis. Results on ISCAS benchmark circuits show that power reduction of up to 94.86% and energy reduction of up to 99.93% can be achieved (compared to equi-probable random-pattern testing) while achieving high fault coverage.

Application Of Rollout Strategy To Test Points Selection For Integer-Coded Fault Wise Table

Selection of Global Minimal Test Points Set for Integer-Coded Fault Wise Table

Design of Test Points Selection and Test Sequencing Problem of Multivalued Fault Dictionary

Test Points Selection for Analog Fault Dictionary Techniques

Entropy Based Test Point Evaluation and Selection Method for Analog Circuit Fault Diagnosis

New Minimum Test Point Set Selection Algorithm Based on Heuristic Graph Search

Simplified Entropy and Multidimensional Search for Test Points Selection

A Novel Test Optimizing Algorithm for Sequential Fault Diagnosis.

Test Point Selection Method for Hierarchical Fault Diagnosis

Board-level Functional Test Selection Based on Fault Tree Analysis

Optimum test points selection in analogue-circuit diagnosis with graphic fault detection and isolation information record

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

A Novel Scheme for Application-Dependent Testing of FPGAs

An Optimization Algorithm for Pre-Bond TSV Probing Tests and Fault Localization

Mixture Test Optimization for Analog System

Test compaction for small-delay defects using an effective path selection scheme

A General Enhancement Method for Test Strategy Generation for the Sequential Fault Diagnosis of Complex Systems

A New Test Point Selection Method for Analog Continuous Parameter Fault

Low-power Weighted Random Pattern Testing

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

Non-Scan Design For Testability Based On Fault Oriented Conflict Analysis